Wafer Level Advanced Parameter Measurement
System
For parametric testing that maximizes the productivity of
technicians and engineers in R&D, the Model 4200-SCS Semiconductor Characterization System combines
lab-grade DC and pulse device characterization, real-time plotting, and analysis with high precision and
sub-femto amp resolution in a fully integrated characterization system. Options include the Model 4210-CVU
Capacitance-Voltage Unit, Model 4225-PMU Ultra-Fast I-V Module, Model 4220-PGU Pulse Generator Unit, and Model
4225-RPM Remote Amplifier/Switch.
The local chambered WaveLink probe station from Signatone
provides the perfect probing foundation for parametric testing with the 4200-SCS. Integrated with the
4210-MMPC-L cabling system allows seamless parametric testing with up to 4 probes. The Wavelink local chamber
probe station is available in 200mm or 300mm; manual or semiautomatic configurations. The removable panels of
the local chamber allow maximum versatility of probe placement and integration with the 4225-RPM. A variety of
linear motion micropositioners assure micron and sub-micron placement of the probe tips. Probe tips are guarded
to within 1mm of the contact. The guarded triaxial chuck is available in ambient, heated or hot/cold
configurations.
Image: WaveLink-210 RF Probe Station
Signatone offer a full range of RF/Microwave Probe stations and accessories that are ideal for
wireless and bluetooth probing applications. With an easy interface to the network analyser range, Signatone
have all of your RF probing requirements covered. Here are just some of the applications that we cover in the
RF field;

Image: WaveLink CAL
Chuck
.jpg)
Image: WaveLink-1160 Microwave Probe
Station
To see the full product range available and
individual product data sheets, please click on the link;
Signatone Probe station
catalogue 
RF Micropositioner and RF probes
High Impedence Active Probes
or visit
Signatone RF/Microwave
Probing
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